File:Mechanistic-insights-into-chemical-and-photochemical-transformations-of-bismuth-vanadate-photoanodes-ncomms12012-s2.ogv
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[edit]DescriptionMechanistic-insights-into-chemical-and-photochemical-transformations-of-bismuth-vanadate-photoanodes-ncomms12012-s2.ogv |
English: Supplementary Movie 1 Direct observation of bismuth vanadate corrosion by in situ EC-AFM. This movie shows time-lapse degradation of a bismuth vanadate (BiVO4) thin film deposited on fluorine-doped tin oxide (FTO), as reported in Figure 5. The measurements were performed in 1 M KPi with an applied bias of 1.23 V vs RHE under dark conditions. Aligned EC-AFM scans were used to monitor BiVO4 corrosion over a total time frame of 160 minutes. |
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Source | Video file from Toma F, Cooper J, Kunzelmann V, McDowell M, Yu J, Larson D, Borys N, Abelyan C, Beeman J, Yu K, Yang J, Chen L, Shaner M, Spurgeon J, Houle F, Persson K, Sharp I (2016). "Mechanistic insights into chemical and photochemical transformations of bismuth vanadate photoanodes". Nature Communications. DOI:10.1038/ncomms12012. PMID 27377305. PMC: 4935965. | ||
Author | Toma F, Cooper J, Kunzelmann V, McDowell M, Yu J, Larson D, Borys N, Abelyan C, Beeman J, Yu K, Yang J, Chen L, Shaner M, Spurgeon J, Houle F, Persson K, Sharp I | ||
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current | 04:24, 27 October 2016 | 4.5 s, 1,600 × 1,200 (181 KB) | Open Access Media Importer Bot (talk | contribs) | Automatically uploaded media file from Open Access source. Please report problems or suggestions here. |
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Short title | Supplementary Movie 1 |
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Author | Toma F, Cooper J, Kunzelmann V, McDowell M, Yu J, Larson D, Borys N, Abelyan C, Beeman J, Yu K, Yang J, Chen L, Shaner M, Spurgeon J, Houle F, Persson K, Sharp I |
Usage terms | http://creativecommons.org/licenses/by/4.0/ |
Image title | Direct observation of bismuth vanadate corrosion by in situ EC-AFM. This movie shows time-lapse degradation of a bismuth vanadate (BiVO4) thin film deposited on fluorine-doped tin oxide (FTO), as reported in Figure 5. The measurements were performed in 1 M KPi with an applied bias of 1.23 V vs RHE under dark conditions. Aligned EC-AFM scans were used to monitor BiVO4 corrosion over a total time frame of 160 minutes. |
Software used | Xiph.Org libtheora 1.1 20090822 (Thusnelda) |
Date and time of digitizing | 2016-07-05 |