File:Tolansky method.svg
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Size of this PNG preview of this SVG file: 800 × 571 pixels. Other resolutions: 320 × 228 pixels | 640 × 457 pixels | 1,024 × 731 pixels | 1,280 × 914 pixels | 2,560 × 1,827 pixels | 950 × 678 pixels.
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| Description |
English: Principle idea of Tolansky-Method for measurement of layer thickness by interferometry. |
| Source | Own work |
| Author | Safe cracker |
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I, the copyright holder of this work, hereby publish it under the following license:
This file is licensed under the Creative Commons Attribution-Share Alike 3.0 Unported license.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 09:42, 22 December 2008 | | 950 × 678 (21 KB) | Safe cracker (talk | contribs) | {{Information |Description={{en|1=Principle idea of Tolansky-Method for measurement of layer thickness by interferometry.}} |Source=Own work by uploader |Author=Safe cracker |Date= |Permission= |other_versions= }} <!--{{ImageUpload| |
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