File:Test2ka2large.jpg

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English: HR-TEM views of electrochemical epitaxy of Cu2O on silicon, in a specimen provided by Jay Switzer at MST-Rolla. The digital darkfield[1] amplitude image of silicon-substrate <110>-cross-section spacings has been loaded into the blue channel. Digital darkfield amplitude image of a very specific 4-degree off-normal Cu2O growth orientation occupies the red channel. The electron phase-contrast brightfield image is in the green channel.
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Author P. Fraundorf

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  1. P. Fraundorf (2004) "Digital darkfield decompositions", arXiv:cond-mat/0403017.

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current12:09, 2 July 2014Thumbnail for version as of 12:09, 2 July 20142,048 × 2,048 (625 KB)Unitsphere (talk | contribs)User created page with UploadWizard

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